Überblick

Open Access

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Peer Reviewed

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Abstract

• A (001) SrTiO3 wafer has been investigated in situ at room temperature under application of a static electric field of varying polarity by fluorescence x-ray absorption near edge structure (XANES) analysis at the Sr-K and Ti-K absorption edges. The XANES spectra show a clear shift of the Ti-K absorption edge energy. The shift is attributed to a change of the Ti valence state in a volume invoked by diffusion of the oxygen ions and vacancies. No shift was observed for the Sr-K absorption edge energy. Theoretical calculations support these findings.

authors

• Matthias Zschornak
• A. A. Levin
• Dirk-Carl Meyer
• E. Gutmann
• Gemming, Sibylle
• Hartmut Stoecker
• K. Rickers
• Leisegang, Tilmann
• T. Weissach

veröffentlicht in

• Physical review letters, Vol.102(8), 087601  Zeitschrift